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The 2022 Network Conference on X-ray diffraction technology and application progress will be held soon, and the agenda will be announced

X-ray diffraction technology is a research means to obtain information such as the composition of substances, the structure or morphology of internal atoms or molecules by X-ray diffraction of substances and analyzing their diffraction patterns. Although neutron diffraction, infrared spectroscopy, Mossbauer spectroscopy and other methods can be used for material structure analysis, X-ray diffraction technology is the most effective and widely used means, and its application scope has penetrated into physics, chemistry, material science and various engineering technology sciences.

In order to promote relevant personnel to deeply understand the development status of X-ray diffraction technology and master relevant application knowledge, the instrument information network will be held on July 15, 2022“X-ray diffraction technology and its application progress”Online conference, invite industry technology and application experts to focus on the cutting-edge technology theory and analysis methods of X-ray diffraction, as well as hot application fields such as material science and drug research and development to share reports.

Meeting schedule

2022年7月15日“X-ray diffraction technology and its application progress”网络会

time

Report title

Guest speaker

09:30–10:00

Rietveld structure refinement principle and Application

Chengguofeng, researcher of Shanghai Institute of silicate, Chinese Academy of Sciences

10:00–10:30

Anton Paar’s new automatic multifunctional powder X-ray apparatus:xrdynamic 500

Manager Li, product manager of antonpa (Shanghai) Trading Co., Ltd

10:30–11:00

Powder XRD data analysis – phase identification

Xuchunhua, chief representative of international diffraction data center in China

11:00–11:30

The latest development of two-dimensional diffraction technology

XRD application manager of Yangning Brooke (Beijing) Technology Co., Ltd

11:30–12:00

Application of X-ray diffraction technology in the study of drug crystal form

Zhou Lina, senior engineer of national industrial crystallization and Engineering Technology Research Center, School of chemical engineering, Tianjin University

11:30–14:00

noon break

14:00–14:30

Capillary focused microbeam X-ray diffraction technique and its application

Cheng Lin, Professor of Beijing Normal University

14:30–15:00

Development of X-ray diffraction multi-function in different diffraction systems

Wang Lin, XRD product manager of malvinpanaco China

15:00–15:30

Sharing of key points of X-ray diffractometer

Yu Na, senior engineer of Shanghai University of science and technology

15:30–16:00

Progress of semefi real-time XRD technology and in situ application

Senior application expert of Juwei material Thermo Fisher Technology (China) Co., Ltd

16:00–16:30

How to use X-ray diffraction technology to carry out crystallographic orientation analysis of metal materials?

Dong Xueguang, assistant director/Senior Engineer of the test center of China Aluminum Materials Application Research Institute Co., Ltd

16:30–17:00

Laser driven ultrafast x/γ Radiation and Application

Chen liming, Professor of Shanghai Jiaotong University


Guest speaker及报告内容(按报告time排序)

Guest speaker:Chengguofeng, researcher of Shanghai Institute of silicate, Chinese Academy of Sciences

Report title:《Rietveld structure refinement principle and Application》

Report Abstract:at present, offsite method is widely used to characterize the structural evolution of materials. This is a characterization of samples after removing induced factors such as temperature and pressure. Although it has reference significance, it can only give the final structure of materials, and cannot obtain accurate information about the real change process. In situ X-ray diffraction technology can obtain real-time dynamic information about the influence of temperature, atmosphere and so on on the crystal structure of materials. This method can directly reflect the change process of structure. It is the most advanced research method of structural phase transition and structural evolution at present. This report will explain the principle of in-situ diffraction technology and its application in material research with specific examples.

Guest speaker:Manager Li, product manager of antonpa (Shanghai) Trading Co., Ltd

Report title:《Anton Paar’s new automatic multifunctional powder X-ray apparatus:xrdynamic 500》

Report Abstract:This report introduces Anton Paar’s new automatic multifunctional powder X-ray instrument xrdynamic 500. This is a multi-functional powder diffractometer, which provides fully automatic and vacuum optical devices, automatic instruments and sample calibration procedures, combined with unparalleled data quality and the highest test efficiency, so that beginners and experts can easily and quickly collect high-quality XRD data.


Guest speaker:Xuchunhua, chief representative of international diffraction data center in China

Report title:《Powder XRD data analysis – phase identification》

Report Abstract:phase identification is one of the basic analysis of powder XRD data analysis. Phase identification analysis must call the diffraction card of the comparison standard, that is, PDF card. ICDD has been committed to collecting, editing, publishing and distributing PDF cards for more than 80 years, which is mainly used for phase identification and quantitative analysis of materials. This report mainly focuses on the principle, analysis method and data quality of phase identification of powder XRD data.


Guest speaker:XRD application manager of Yangning Brooke (Beijing) Technology Co., Ltd

Report title:《The latest development of two-dimensional diffraction technology》

Abstract:the two-dimensional diffraction function is one of the development trends of diffractometers, and it also greatly promotes the rapid development of many application fields. The popularity and development of two-dimensional diffraction benefit from the development of two-dimensional detector and light source technology in recent years. This report will discuss the latest hardware and software technology of two-dimensional diffraction technology, and introduce the latest achievements and examples of two-dimensional diffraction application.

Guest speaker:Zhou Lina, senior engineer of national industrial crystallization and Engineering Technology Research Center, School of chemical engineering, Tianjin University

Report title:《Application of X-ray diffraction technology in the study of drug crystal form》

Abstract:in recent years, more and more drug developers have paid attention to the study of drug crystal forms. In the process of developing drug crystal forms, X-ray diffraction technology, as an important means of crystal form analysis, is often used in the qualitative and quantitative analysis of drug crystal forms, especially in the examination of drug stability, the screening of polymorphic forms and eutectic, the analysis of crystallinity, the quantitative analysis of different crystal forms and so on.


Guest speaker:Cheng Lin, Professor of Beijing Normal University

Report title:《Capillary focused microbeam X-ray diffraction technique and its application》

Abstract:This report introduces the characteristics and application of two capillary focused microbeam X-ray diffractometers developed by our laboratory. The first kind of microbeam X-ray diffractometer is based on the characteristics and application of capillary focused 50W low-power X-ray diffractometer. The micro area diameter of the analyzed sample is 30 μ m ~ 100 μ m; The second is to use the characteristics of capillary micro convergent lens to establish an adaptive beam spot x-ray diffraction analysis. It can realize the X-ray diffraction analysis of the point light source with the focal spot diameter of the analysis sample in the range of 0.5mm ~ 5mm, which can not only realize the micro area analysis of 0.5mm, but also realize the conventional analysis of a large area. The application research of this adaptive beam spot x-ray diffraction analysis is introduced.

Guest speaker:Wang Lin, XRD product manager of malvinpanaco China

Report title:《Development of X-ray diffraction multi-function in different diffraction systems》

Report Abstract:in X-ray diffraction analysis, the characteristic radiation of different targets will stimulate the extremely strong fluorescence effect of some corresponding elements, causing the overall background of the test data to be high, the detection sensitivity of weak diffraction peaks to be reduced, and interfering with the accurate analysis of samples. At present, malvinpanaco has built a unique high-definition optical path on the sharp image diffractometer. With the quasi monochromatic incoming optical path module bbhd or the focusing optical mirror module, combined with the new full wavelength energy dispersion detector 1der, it provides users with high-quality diffraction data without fluorescence interference of all elements. High definition optical path technology is applicable to copper, cobalt, molybdenum, silver and other targets commonly used in diffractometers. Users can freely choose targets according to sample conditions to obtain the best possible test results. Due to the volume limitation, the table diffractometer is traditionally only used for routine powder diffraction testing. Malvinpanaco has recently released the thin film grazing incidence attachment and transmission diffraction attachment designed based on the prefix pre calibration concept on the bench top diffractometer Aeris, which extends the sample testing range to polycrystalline films, polymers, drugs and other light absorbing samples trapped in preferred orientation, providing more choices for users with limited space.


Guest speaker:Yu Na, senior engineer of Shanghai University of science and technology

Report title:《Sharing of key points of X-ray diffractometer》

Report Abstract:Part I:introduction to laboratory instruments; The second part:introduce the places where students are easy to encounter problems in the experimental process and the corresponding solutions with specific examples; Part III:introduce the work related to in-situ testing in XRD Laboratory of Shanghai University of science and technology.


Guest speaker:Senior application expert of Juwei material Thermo Fisher Technology (China) Co., Ltd

Report title:《Progress of semefi real-time XRD technology and in situ application》

Abstract:powder X-ray diffraction (XRD) is a modern analytical technique commonly used in material laboratories, which can accurately obtain detailed material structure and phase information. As a general-purpose instrument, the conventional functions and applications of XRD have been gradually popularized in universities, research institutions and some industrial users. In recent years, more and more users pay attention to in-situ applications. This report will introduce semefi’s real-time XRD technology and its application progress in in situ testing.


Guest speaker:Dong Xueguang, assistant director/Senior Engineer of the test center of China Aluminum Materials Application Research Institute Co., Ltd

Report title:《How to use X-ray diffraction technology to carry out crystallographic orientation analysis of metal materials?》

Report summary:1 The concept of crystallographic orientation texture of metallic materials? 2. Why study texture? 3. What methods can be used to test texture, and what are the advantages and disadvantages? 4. What is the bottom”code” of X-ray texture calculation? 5. What are the common textures in face centered cubic metals? What is the evolution law? 6. What is X-ray diffraction in situ stretching? How about its technology?


Guest speaker:Chen liming, Professor of Shanghai Jiaotong University

Report title:《Laser driven ultrafast x/γ Radiation and Application》

报告摘要:X射线光源具有很高的时空分辨能力,对物质的瞬态结构和超快动力学过程研究意义重大。目前由于电子的库伦效应,激发辐射源的电子束密度较小,导致要么是连续的辐射(X光管)不能满足超快诊断的要求,要么辐射装置体积庞大、造价昂贵(如同步辐射),加上较长的泵浦-探针同步精度制约了其在超快领域的应用。飞秒激光驱动的台面化超快X射线源具有超亮、极短、精确同步等特征,是传统光源在超快领域的有力补充,成为领域重要的研究热点。我们长期致力于激光超快X射线领域的国际难点问题研究,揭示了制约辐射源品质提升的根源,在X射线产生效率、信噪比等方面突破了多项瓶颈,创造性地提出了多项新的物理机制(概念)并通过实验予以验证,从而开拓了系列具有重要应用价值的超强极短X射线光源,源品质参数引起了领域广泛关注并已经应用于国家重大科技基础设施建设之中。其在超快成像、超快衍射中的飞秒time分辨能力,已经得到实验了验证。这些成果和用户装置,可广泛应用于物质的瞬态结构和超快动力学研究之中。

Way of attending the meeting (both mobile phones and computers can attend the meeting)

1. Free registration on the official website (ClickLink hereOr scan the QR code below to register for the hearing);

2. You will receive a notice after you have successfully registered and passed the examination;

3. On the day of the meeting, you will收到短信提醒。点击短信链接,输入报名手机号,即可参会。

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